Sim-vs-Silicon Spike-Complexity Probe

A bring-up validation tool for neuromorphic chips: run the same stimulus through the SNN simulator and the fabricated chip, compare the normalized Lempel-Ziv complexity of the two spike rasters, and flag device mismatch or faults when the numbers diverge beyond calibrated tolerance bands. The paper's 'confound' — that the metric tracks firing statistics — becomes the feature for catching silicon that drifts from design intent.